Welcome

The 20^th International Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods (TXRF2025) will be held on September 9-12, 2025 at the Jan Kochanowski University in Kielce, Poland.

Scope of the TXRF Conference:

The biannual TXRF conference is a forum for experts and users of TXRF and related techniques. The scope is to jointly present and discuss recent advances, latest research, and new perspectives in different fields of TXRF from the fundamentals to the applications. As previous editions, the TXRF 2025 will bring together scientists, end-users, and manufacturers, being an excellent platform for networking and exchange.

History of the Conference:

After long years of experimental work on instrumental development, the first International Conference on Total Reflection X-ray fluorescence Analysis and Related Methods (also known as TXRF conference) was held in 1986, in Geesthacht, Germany. Subsequently, nineteen more conferences have been organized in different countries on a biannual basis.

International Advisory Board:

• A. von Bohlen, Germany
• J. Boman, Sweden
• L. Carvalho, Portugal
• L. E. Depero, Italy
• Y. Goshi, Japan
• R. van Grieken, Belgium
• J. Kawai, Japan
• E. Marguí, Spain
• G. Pepponi, Italy
• P. Pianetta, USA
• H. J. Sánchez, Argentina
• C. Streli, Austria
• K. Taniguchi, Japan
• K. Tsuji, Japan
• C. Vásquez, Argentina
• P. Wobrauschek, Austria
• M. A. Zaitz, USA
• G. Zaray, Hungary

The project is co-financed from the state budget, allocated by the Minister of Science under the Excellent Science II Programme (Poland).